Next-generation EDXRF for everyday quality control

The NEX QC II Series is the next generation of Rigaku’s popular benchtop EDXRF spectrometers for routine quality control. The instruments deliver fast, non-destructive elemental analysis from sodium (Na) to uranium (U) in solid samples, liquids, powders, coatings, and thin films. With an embedded computer, icon-driven touchscreen, and integrated printer, the systems are easy to get started with, even for users without prior XRF experience. Ideal for daily quality control in the lab, at the production line, or in the field.

The second generation builds on the proven NEX QC platform with an upgraded silicon drift detector featuring a graphene window, refined optics, and improved sensitivity for light elements.

Models in the series

NEX QC II is the base model, optimized for everyday routine control. The user-friendly touchscreen guides the operator from sample loading to results, and the compact footprint fits easily into tight spaces.

NEX QC II+ is the high-performance model in the series, featuring a high-resolution SDD detector that delivers better sensitivity for light elements and tighter detection limits. Ideal for more demanding applications or higher sample throughput, with the same simple user experience as the base model.

NEX QC+ QuantEZ from the first generation remains available for users who require the extended capabilities of the QuantEZ software, including RPF-SQX Fundamental Parameters and the optional SureDI add-on for FDA 21 CFR Part 11 compliance. Suitable for laboratories with advanced method development needs or regulatory requirements.

Want to learn more about EDXRF?

Do you have questions about EDXRF, your samples, or which solution best fits your needs? Get in touch and we will help you choose the right instrument and application for your specific requirements.

Questions? Contact our product managers for more information.

NEX QC II Series brochure