Next-generation EDXRF spectrometers for precise material analysis

The NEX CG II Series represents the next generation of energy dispersive X-ray fluorescence (EDXRF) spectrometers.

These advanced instruments provide fast and reliable qualitative and quantitative analysis of both major and trace elements across a wide range of sample types – from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films. Ideal for everything from industrial quality control to cutting-edge research applications.

NEX CG II Series Features

• Non-destructive elemental analysis from sodium (Na) to uranium (U)
• Fast elemental analysis of solids, liquids, powders, coatings, and thin films
• Indirect excitation for exceptionally low detection limits
• High-performance X-ray tubes (50 kV 50 W or 65 kV 100 W)
• Large-area, high-throughput Silicon Drift Detector (SDD) for maximum data efficiency
• Analysis in air, helium, or vacuum
• Powerful and user-friendly QuantEZ software with multilingual interface
• Advanced RPF-SQX Fundamental Parameters software featuring Scattering FP
• Rigaku Profile Fitting (RPF) – advanced algorithm for precise peak deconvolution
• Multiple automatic sample changers for samples up to 52 mm
• Low cost of ownership

Rigaku NEX CG II